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2012/02/22XV
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1 ƒ}ƒbƒtƒ‹˜Fi“d‹C˜Fj ISUZU STS-310K 
2 P‰·P޼Ší ƒ^ƒoƒCƒGƒXƒyƒbƒN PH-2KTFeb-2006
3 P‰·Ší ƒ^ƒoƒCƒGƒXƒyƒbƒN PU-3KPFeb-2006
4 ƒvƒ[ƒo[ TSK A-PM-50A2000
5 •\–ÊŒ`󑪒èŠí Veeco DEKTAK3Feb-2000
6 ŽÀ‘ÌŒ°”÷‹¾ NIKON SMZ-101985
7 ICŒŸ¸Œ°”÷‹¾ NIKON Photo1993
8 Œ°”÷‹¾ NIKON Optiphoto 
9 ƒ}ƒCƒPƒ‹ƒ\ƒ“Š±ÂŒ°”÷‹¾ aKŒõŠwH‹Æ MI-uS 
10 AFM Veeco Nanoscoope IIIa1993
11 ƒvƒ[ƒo[ “Œ‹ž¸–§ A-PM-90A 
12 Wafer thickness tester TECC DWI-L 
13 ƒvƒ[ƒo[ “Œ‹ž¸–§ A-PM-60B/C1998
14 ƒ`ƒbƒvŽ©“®‘I•Ê‹@ EMTEC WCS-811C2002
15 ƒŒ[ƒU[ƒgƒŠƒ}[ NEC SL216AD2002
16 SEM JEOL JSM-6360A/EDX2003
17 ‚RŽŸŒ³ŒõŠwƒvƒƒtƒ@ƒCƒ‰[ƒVƒXƒeƒ€ ZYGO New@View72002009
18 CHNƒR[ƒ_[iŒ³‘f•ªÍ‘•’uj ƒ„ƒiƒR•ªÍH‹Æ MT-62001
19 ƒvƒ[ƒo[ “Œ‹ž¸–§ UF200 
20 P‰·P޼Ší ƒ^ƒoƒCƒGƒXƒyƒbƒN PH-3KTFeb-2006
21 ƒƒCƒhƒrƒ…[P‰·Ší ƒ^ƒoƒCƒGƒXƒyƒbƒN PWU-2KPFeb-2006
22 MEMORY TESTER ADVANTEST T5581P1997
23 ‰¡’·ƒƒCƒh@‹­§zŠÂŽ®P‰·Ší ‚¢‚·U»ìŠ EPEC-154Aug.-2009
24 ƒŠƒ[ƒN^ƒvƒŠƒq[ƒ^^ƒtƒBƒNƒXƒ`ƒƒ[ƒZƒbƒg ”’Œõ(HAKKO) FR-803B/FR-820/C1392BAug.-2009
25 PURE WATER PARTICLE MONITOR
ƒ…bƒp[ƒeƒBƒNƒ‹ƒ‚ƒjƒ^
RION XP-L42002
26 PARTICLE COUNTER Rion KM-202005
27 DIGITAL HD MICROSCOPE
ƒfƒWƒ^ƒ‹HDƒ}ƒCƒNƒƒXƒR[ƒv
KEYENCE VH-6300 
28 PROBER TSK UF200SA 
29 PROBER TEL P-81996
30 WOFER EXTENDER
ƒEƒFƒn[Šg’£‹@
Hugle Electronics ‚g‚r-18001997
31 IC Prober TEL P-8XL2004
32 Digital microscope Keyence VH-7000C 

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